[Colloquium] [Announce] Seminar Announcement: Computation of Imaging-Based Science

[Gordon L. Kindlmann]

Apologies for omitting the date: this will be tomorrow starting at 2:30

On Nov 15, 2011, at 11:42 AM, Gordon L. Kindlmann wrote:

> Computation Institute: Computation of Imaging-Based Science
> 
> Speakers: Stefan Vogt (Argonne APS) and Chris Jacobsen (Argonne APS)
> Host: Gordon L. Kindlmann 
> Date: Nov 16, 2011
> Time: 2:30 PM - 5:30 PM
> Location: University of Chicago, Searle 240A, 5735 S. Ellis Avenue
> 
> Computation of Imaging-Based Science
> 
> All visitors are welcome to join the next meeting of the Computation of Imaging-Based Science seminar, with two speakers at 2:30 and 4:15. Those not able to attend in person are welcome to watch and listen in via Adobe Connect, at http://anl.adobeconnect.com/cibs/
> 
> 2:30: Stefan Vogt: "Hyperspectral imaging: visualizing trace elements and chemical state" Scanning X-ray microscopy is a powerful technique to map and quantify element distributions in numerous applications ranging from the investigation of impurities in solar cell material to determing trace elemental content of biological specimens such as cells and bacteria. It provides attogram sensitivity for transition metals like Cu, Zn. Making use of tomographic approaches, 3D elemental distribution can be acquired and visualized. Changing the incident x-ray energy permits probing the chemical state of elements of interest, using x-ray fluorescence for maximum sensitivity for medium and heavier elements, or using absoption contrast for the low Z elemental content. Ever faster detectors, better optics, and much improved data acquisition strategies provide great opportunities - their full realization requires advances in data analysis, abstraction and visualization. We will summarize state of the art X-ray fluorescence microscopy, identify existing challenges, and speculate on future opportunities and unique applications.
> 
> 4:15: Chris Jacobsen: "Computing x-ray phase contrast images with and without lenses" With multi-keV X rays, phase contrast is often a thousand times stronger than absorption contrast; however, a century of radiography has been based on absorption contrast imaging. Two approaches to phase contrast x-ray imaging will be described. In lens-based scanning x-ray microscopy, one can obtain phase contrast images either by computational analysis of the refraction and diffraction of the x-ray beam by the specimen being imaged, or use the Zernike method to introduce phase contrast into intensity recordings. Coherent diffraction imaging offers a way to instead obtain phase and absorption contrast images without requiring any optics, by using iterative phase retrieval procedures. Computational issues in image reconstruction will be discussed.
> 
> Further information about these and future speakers is available here:
> http://www.ci.uchicago.edu/wiki/bin/view/CIBS
> _______________________________________________
> Announce mailing list
> Announce at ci.uchicago.edu
> https://lists.ci.uchicago.edu/cgi-bin/mailman/listinfo/announce

-------------- next part --------------
An HTML attachment was scrubbed...
URL: http://mailman.cs.uchicago.edu/pipermail/colloquium/attachments/20111115/2e311fd9/attachment.htm